供應薄膜測量儀器-美國科學計算公司(SCI)
供應薄膜測試儀器-美國科學計算公司(SCI)
網址:www.sci-soft.com

SCI FilmTek TM Systems(薄膜測量儀器測試功能說明)可測量:
Index of Refraction折射指數(shù)(at 2μm thickness)
Thickness Measurement Range 厚度測量范圍
Maximum Spectral Range 較大光譜范圍
Standard Spectral Range標準光譜范圍
Reflection反射測量
Transmission透射測量
Optional Spectroscopic Ellipsometry可選擇的光譜橢圓偏光法測量
Power Spectral Density功率譜密度測量
Multi-angle Measurements (DPSD) 多角度測量
Both TE & TM Components of Index
Multi-layer thickness多層厚度測量
Index of Refraction折射系數(shù)測量
Extinction (absorption) Coefficient消光(吸收)系數(shù)
Energy band gap能量帶隙測量
Composition成分測量
Crystallinity晶狀測量
Inhomogeneous Layers非均勻層測量
Surface Roughness表面粗糙度測量
A variety of options can extend these standard measurement capabilities.

Typical applications典型應用:
Flat panel display平板顯示器薄膜\OLED有機發(fā)光二級管薄膜
Semiconductor and dielectric materials半導體和電介質材料薄膜\Computer disks計算機磁盤薄膜
Multilayer optical coatings多層光學涂層薄膜\Coated glass有涂層的玻璃薄膜
Optical antireflection coatings光學抗反射涂層薄膜\aser mirrors激光鏡薄膜
Electro-optical materials電鍍光學材料薄膜\hin Metals薄金屬薄膜

Example Films薄膜范例:
SiOx氧化硅薄膜\a-Si非晶硅薄膜\Alq3
SiNx氮化硅薄膜\a-C:H氧化類金剛石薄膜\HIL
DLC類金剛石薄膜\ITO錫銦氧化物薄膜\BEML
SOG 玻璃上系統(tǒng)薄膜\Polysilicon多晶硅薄膜\GEML
Photoresist光刻膠薄膜\Polyimide聚酰亞胺薄膜\ETL
Thin Metals薄金屬薄膜\Color Dye彩色染料薄膜\REML

Example Substrates襯底范例:
Silicon 硅襯底 GaAs砷化鎵襯底
SOI襯底 Glass玻璃襯底
SOS襯底 Aluminum鋁襯底