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            化工儀器網(wǎng)>產(chǎn)品展廳>物理特性分析儀器>粒度儀>其它粒度分析儀> MADlink 100微孔徑快速測(cè)量?jī)x

            MADlink 100微孔徑快速測(cè)量?jī)x

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            • 公司名稱(chēng) 珠海真理光學(xué)儀器有限公司
            • 品牌 linkoptik/真理光學(xué)
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            • 產(chǎn)地
            • 廠商性質(zhì) 生產(chǎn)廠家
            • 更新時(shí)間 2023/5/8 14:16:49
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            真理光學(xué)儀器有限公司專(zhuān)注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動(dòng)態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測(cè)系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶(hù)提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

            真理光學(xué)匯集了以張福根博士為代表的全國(guó)顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長(zhǎng)兼首Xi科學(xué)家,還擔(dān)任全國(guó)顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會(huì)副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國(guó)顆粒學(xué)會(huì)副理事長(zhǎng),同時(shí)也是“歐美克”字號(hào)公司的創(chuàng)始人。曾擔(dān)任英國(guó)某粒度儀器公司中國(guó)總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國(guó)顆粒學(xué)會(huì)青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

            激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對(duì)當(dāng)前市面上儀器存在的不足,展開(kāi)了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛(ài)里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測(cè)量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測(cè)量粒徑)的一般公式;研究了衍射儀器的測(cè)量上限和下限;研究了顆粒折射率偏差對(duì)測(cè)量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測(cè)量盲區(qū)的問(wèn)題,使衍射儀器的亞微米顆粒測(cè)量水平顯著提高;提出了統(tǒng)一的反演算法(專(zhuān)有技術(shù)),消除了不同計(jì)算模式給出不同結(jié)果的尷尬;設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測(cè)量的精度不亞于濕法測(cè)量,對(duì)高速?lài)婌F場(chǎng)的測(cè)量(時(shí)間)分辨率也更高。

            在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測(cè)量重復(fù)性大幅度提高。

            Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

            Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

            Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

            In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




            專(zhuān)注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測(cè)試技術(shù)的研發(fā)和儀器的生產(chǎn)銷(xiāo)售

            產(chǎn)地類(lèi)別 國(guó)產(chǎn) 應(yīng)用領(lǐng)域 制藥

            MADlink 100微孔徑快速測(cè)量?jī)x是一款專(zhuān)門(mén)應(yīng)用于快速測(cè)量薄片上的微孔直徑的光學(xué)儀器,有效解決了傳統(tǒng)方法光學(xué)采用顯微圖像處理技術(shù)和電子顯微鏡都無(wú)法實(shí)現(xiàn)對(duì)薄片微孔孔徑全檢的技術(shù)難題。其特點(diǎn)是對(duì)薄片全域范圍(最大面積5.0x4.5mm)的所有微孔只需一次抓拍,即可輸出薄片上全部微孔的孔徑特征、孔徑分布和微孔位置分布圖。


            圖1:微孔片樣品圖

               薄片微孔徑是指在平板薄片上的尺寸達(dá)微米甚至亞微米大小的小孔的直徑。

               普通的光學(xué)顯微鏡受到光學(xué)衍射現(xiàn)象的限制,最高分辨力只能達(dá)到0.5μm左右,因此用普通的光學(xué)顯微鏡測(cè)量1μm左右的微孔,誤差顯然過(guò)大;況且此時(shí)只能用40倍或以上的顯微物鏡,視場(chǎng)大小只能達(dá)到0.2mm或者更小。對(duì)于制作在薄片上、位置分布范圍達(dá)數(shù)毫米的微孔片,不可能做到全域一次抓拍。即便通過(guò)分區(qū)掃描測(cè)量也許耗費(fèi)大量時(shí)間,且難免出現(xiàn)漏檢問(wèn)題。如果使用低倍顯微物鏡做全域拍攝測(cè)量,例如2倍,則由于低倍物鏡的數(shù)值孔徑很?。?倍物鏡的數(shù)值孔徑只有0.06),孔徑限制造成的衍射光斑(愛(ài)里斑)直徑可達(dá)到10μm左右,用這樣的鏡頭觀察數(shù)十微米量級(jí)的微孔,會(huì)產(chǎn)生顯著的模糊,而對(duì)1μm量級(jí)的微孔,普通的光學(xué)顯微鏡的圖像已經(jīng)不能反映孔的大小。所以,基于光學(xué)顯微放大和數(shù)字圖像處理技術(shù)的測(cè)量系統(tǒng)難以完成這類(lèi)微孔徑的全域快速測(cè)量。電子顯微鏡雖然具有更好的景深和分辨能力,但單次測(cè)量視場(chǎng)更小,使用成本也十分高昂,不太適合廣泛應(yīng)用在薄片微孔徑的快速測(cè)量。


            圖2:工作原理圖

            MADlink 100微孔徑快速測(cè)量?jī)x采用真理光學(xué)團(tuán)隊(duì)研發(fā)的光通量微孔徑測(cè)量法,利用透過(guò)微孔的光通量與孔面積成正比的關(guān)系,如下圖示,本有效規(guī)避了光學(xué)顯微成像方法中的(成像透鏡)光學(xué)衍射對(duì)微孔徑尺寸測(cè)量準(zhǔn)確度的制約。


            圖3:光通量--孔徑曲線關(guān)系圖


               根據(jù)圖像傳感器檢測(cè)得每個(gè)孔的光通量值計(jì)算微孔孔徑,同時(shí)對(duì)微孔本身的光學(xué)衍射造成的光能損失進(jìn)行修正,從而實(shí)現(xiàn)微孔直徑的全域一次抓拍即可快速完成對(duì)區(qū)域內(nèi)全部微孔孔徑的測(cè)量,最后輸出微孔徑分布曲線和空間位置分布圖。


            圖4:典型分析測(cè)試報(bào)告





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