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            湖南格雷柏電子科技有限公司
                                                                        
            
										  中級(jí)會(huì)員 | 第3年									
            
                                    								
            

							
            
						
            
                        

					
            
										
            
						
            
                            							
            
								
            
								
            
									
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            ES640 Charged Device Model (CDM) Test System 
            
					
                                
					                        
						
            
                        
            
                            						        
            
							    
							    								    
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            品       牌ESDEMC
            
		                                
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				                        電子/電池,航空航天,汽車及零部件,電氣
				                        				                    				                
            
				            
            
				            
            
				            ES640 Charged Device Model (CDM) Test System
            Charged Device Model (CDM) electrostatic discharge is a common cause of microelectronic circuit failure.
            
				        
				        
            
				            
            ES640 Charged Device Model (CDM) Test System
            1.    Introduction
            Charged Device Model (CDM) electrostatic discharge is a common cause of microelectronic circuit failure. Sensitive devices can be seriously damaged or destroyed by a CDM discharge at relatively low voltage. This often occurs when the static charged device contacts a metal surface at a different potential. Such an electrostatic discharge often has an extremely fast rise time.
            The Model ES640 is a robotic CDM (Charged Device Model) tester designed to meet all popular CDM ESD test methods, allowing both field induced air discharge methods (FICDM) and relay based contact discharge methods (LI-CCDM, CC-TLP, RP-CCDM). The system includes a computer, environment-controlled chamber, precision XYZ motion system, different types of CDM tester modules, and an automated test and data analysis software.
            Here is a comparison between ESDEMC ES640 CDM Solution to others, including Thermo Scientific Orion3 CDM tester .
            2.    Features
                  
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              High resolution cameras (up to 3) allow for easy pin alignment operation
                  
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              High resolution motion control system (down to 1 µm step)
                  
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              Allows multiple devices being tested in a batch
                  
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              Patent-pending CCDM method allows better repeatability
                  
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              Airtight environment chamber increases drying unit efficiency
                  
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              Support regenerative drying unit (no need of nitrogen)
                  
            3.    Applications
                  
            •     
              General charged device model (CDM) system for package and wafer level tests
                  
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              Support many popular latest CDM methods:
                  
                        
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                ANSI/ESDA/JEDEC JS-002 (FICDM)
                        
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                AEC Q100-011 Rev-D (2019 Ver. follows JS-002)
                        
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                AEC Q101-005 Rev-A (2019 Ver. follows JS-002)
                        
                •         
              •         
                ANSI/ESD SP5.3.3 (LI-CCDM, vf-TLP required)
                        
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                CC-TLP (ESDA SP pending, vf-TLP required)
                        
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                Patent pending RP-CCDM method
                        
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                Legacy and customized solutions available upon request
                        
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              Customizable dimension for robotic CBM (Charged Board Model) and flat panel ESD test
                  
            4.    Specifications
             
                        
                        Parameters            ES640-150            ES640-300            Units            Comments        
                    
                        Max XY Motion Area            ≥ 150 X 150            ≥ 300 X 300            mm            Probe motion area, customizable        
                    
                        Max DUT Area            160 X 160            375 X 425            mm            MAX Field plate area for DUT        
                    
                        Field Plate Area            210 X 210            395 X 470            mm            Field plate area        
                    
                        Z Travel            ≥ 50            mm                     
                    
                        Min X, Y, Z Step Size            100            nm                     
                    
                        Reposition Repeatability            ≤ ±6            μm                     
                    
                        Test Voltage Range            ±1 to 2000 or 4000            V            Default 2000V, customizable        
                    
                        Test Voltage Step            1            V                     
                    
                        Test Voltage Accuracy            ± 1% ± 0.1V            %  V                     
                    
                        XY Vision Resolution            1920 X 1080            Pixel                     
                    
                        Vertical Vision Resolution            2592 X 1944            Pixel                     
                    
                        Operating Temperature            10 to 40            (°C)                     
                    
                        Operating Humidity (RH)            0 to 80            %                     
                    
                        Power            120-240 VAC, 50/60 Hz            VAC                     
                    
                        N2 or CDA Pressure            10 – 120            PSI                     
                    
                        N2 or CDA Peak Usage            0.2            cfm            (or 0.34 m3h)        
                    
                        300 N2 Tank Avg Usage            ~ 19            hour            Continuous @ 40RH environment        
                    
                        Desiccant Avg Usage            ~ 24            hour            Continuous @ 40RH environment        
                
             
            5.    Ordering Information
            ES640 Charged Device Model (CDM) Test System
                        
                        Line            Part # or Option #            Description        
                    
                        ES640 Charged Device Model (CDM) Test System        
                    
                        1.1            ES640-150            Universal CDM platform, 150 X 150 mm Test Area, 2 kV        
                    
                        1.2            ES640-300            Universal CDM platform, 300 X 300 mm Test Area, 2 kV        
                    
                        1.3            ES640-HC            Humidity Conditioning Unit for Air Discharge Methods
                        (Uses reusable desiccants, lower cost of usage than N2 or CDA)            		        
                    
                        1.4            ES640-CV4            Charge Voltage Upgrade from 2kV to 4 kV        
                    
                        ANSI/ESDA/JEDEC JS-002 Standard Related Test Solution (Followed standards include AEC_Q100-011D, AEC_Q101-005A)        
                    
                        2.1            ES640-JS002            JS-002 Solution – System Integration Package (Including One ES640-JS002-1 Test Fixture)        
                    
                        2.2            ES640-JS002-C            JS002/C101 Calibration Disc (6.8 pF and 55 pF)        
                    
                        2.3            ES640-JS002-1            JS-002 Test Fixture #1 (Discharge Tip 250 µm, body diameter 350 µm)        
                    
                        2.4            ES640-JS002-2            JS-002 Test Fixture #2 (Discharge Tip 120 µm, body diameter 200 µm)        
                    
                        ANSI/ESD S5.3.1-2009 Standard Related Solution (Not recommend for new designs)        
                    
                        3.1            ES640-S09-F            ANSI/ESD S5.3.1-2009_FI-CDM Discharge Unit        
                    
                        3.2            ES640-S09-D            ANSI/ESD S5.3.1-2009_D-CDM Discharge Unit        
                    
                        3.3            ES640-S09-C            ANSI/ESD FR4 Calibration Module (4 and 30 pF)        
                    
                        3.4            ES640-J13            JEDEC-JESD22-C101F-2013 FI-CDM Discharge Unit        
                    
                        RP-CCDM Contact First CDM Solutions (New methods for discharge stability improvements, not standardized yet)        
                    
                        4.1            ES640-RPCCDM            ESDEMC Patented Contact First CDM Solution            
             
                        
            (Very repeatable contact first method, meets JS002 requirement, not require VF-TLP)
                        
            (Including one ES640-PRCCDM-P1 Discharge Unit)
                                    		        
                    
                        4.2            ES640-RPCCDM-P1            RP-CCDM Discharge Unit for Packaged Device        
                    
                        4.3            ES640-RPCCDM-W1            RP-CCDM Discharge Unit for Bare-die & Wafer Device        
                    
                        LI-CCDM Contact First CDM solution        
                    
                        5.1            ES640-LICCDM            LI-CCDM Discharge Solution – System Integration Package
                        (Including one ES640-LICCDM -P1 Discharge unit, require VF-TLP)            		        
                    
                        5.2            ES640-LICCDM-P1            LI-CCDM Discharge Unit for Packaged Device        
                    
                        5.3            ES640-LICCDM-W1            LI-CCDM Discharge Unit for Bare-die & Wafer Device        
                    
                        5.4            ES640-vfTLP            VF-TLP module for CC-TLP or LI-CCDM Method
                        (This VF-TLP module is a compact VF-TLP for the ES640 system. The default configuration is 1 rise-time + 1 pulse-width with limited expansion capability. If more pulse shape options are needed, model ES622 TLP/VF-TLP is the best option)            		        
                    
                        CC-TLP Solution        
                    
                        6.1            ES640-CCTLP            CC-TLP Solution – System Integration Package
                        (Including 1 set of ES640-CCTLP-1-50 & calibration gauge)            		        
                    
                        6.2            CC-TLP-1-50            CC-TLP Discharge Unit with 50m OD GND Plate        
                    
                        6.3            CC-TLP-1-100            CC-TLP Discharge Unit with 100m OD GND Plate        
                    
                        6.4            CC-TLP-1-Cal            CC-TLP calibration gauge for needle height        
                    
                        Third Party Instruments for CDM System        
                    
                        7.1            MISC-OSC2G            Digital Oscilloscope (2 GHz, 20 Gs)        
                    
                        7.2            MISC-OSC6G            Digital Oscilloscope (6 GHz, 20 Gs) 
                        
                        ES640 Charged Device Model (CDM) Test System            		        
                
             
             
             
            
				        
            
                                                                                        				    
            
				
            
			
            
		
            

       
        

		

        

		



  
    
    				
			

		
    
    
    
    
    
    
    
    
    
    

    

     
     
     
	 




	 
	
	
	

            
	
            
		
            
			
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